Multi-layered graphene sample

Graphene monolayer, bilayer and other multiple-layer regions identified

StreamLine™ Plus image showing the distribution of different thicknesses within a graphene flake

Map area: 110 µm x 120 µm

Spectra generated: 40,000

Acquisition time: 14 minutes

CVD diamond film

Polished surface of polycrystalline diamond film grown by CVD technique

Images show information on crystal shape, orientation, stresses and defect densities

Map area: 175 µm x 88 µm

Spectra generated: 51,200

Acquisition time: 2 imaging experiments, 15 minutes each (first acquisition used to generate three Raman images, second acquisition used to generate photoluminescence image)

Image 1: Raman image showing 1 cm^-1 variation in position of the 1332 cm^-1 diamond band

Image 2: Raman image showing 2 cm^-1 variation in width of the 1332 cm^-1 diamond band

Image 3: Raman image showing variation in peak area of the 1332 cm^-1 diamond band

Image 4: Photoluminescence image showing variation in the intensity of the 1.68 eV neutral silicon vacancy [Si-V]⁰ band

Micro indentation in silicon wafer

Peak position

Peak position derived from curve-fit analysis

Map area: 10 µm x 10 µm

Spectra generated: 10,000

Acquisition time: 36 minutes (single acquisition analysed for both images)

Scan details: 100 nm step achieved using piezoelectic scanning stage

Peak width

Peak width derived from curve-fit analysis

Sandstone from Loch Torridon, Scotland

StreamLine™ Plus image showing the distribution of Anatase (TiO₂) (red), Quartz (SiO₂) (green) and Haematite (Fe₂O₃) (blue)

Area of section: 500 µm x 320 µm

Spectra generated: 67,200

Acquisition time: 20 minutes

Polymer laminate (PS and PMMA)

StreamLine™ Plus image of polymer laminate sample showing the distribution of PMMA (red), Epoxy (green) and PS (blue)

Map area: 240 µm x 645 µm

Spectra generated: 17,200

Acquisition time: 7 minutes

Strained S-Ge cross-hatch

StreamLine™ Plus image of a Si-Ge semiconductor sample exhibiting a strained structure. The map shows variation in the Si-Si 510 cm^-1 band position (~0.2 cm^-1 positional band shift). The map data was generated using curve fitting.

Map area: 129µm x 130µm

Spectra generated: 55,000

Acquisition time: 13 minutes

Tooth section

StreamLine™ Plus image of a sectioned tooth, highlighting the enamel (green), dentine (blue) and areas of high fluorescence (red)

Map area: 9mm x 16mm

Spectra generated: 84,000

Acquisition time: 20 minutes

Laser induced crystalline silicon tracks

StreamLine™ Plus image of laser induced crystalline silicon tracks on amorphous substrate

Map area: 550µm x 550µm

Spectra generated: 70,000

Acquisition time: 17 minutes